Hsin-Wei Huang

Title: Hsin-Wei Huang: Innovator in Testing Systems

Introduction

Hsin-Wei Huang is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of testing systems, holding a total of five patents. His innovative approaches have advanced the efficiency and effectiveness of testing devices.

Latest Patents

Huang's latest patents include a "System and method of testing single DUT through multiple cores in parallel." This patent provides a method for testing a single device under test (DUT) through multiple cores in parallel. The method involves calculating the test quantity of the DUT and evenly allocating this quantity to several test cores, thereby controlling the testing period through parallel processing. Another notable patent is the "Test system and method of operating the same," which describes a test system comprising multiple test core devices and first buses. These components are electrically connected to the DUT, allowing for enhanced testing capabilities.

Career Highlights

Throughout his career, Hsin-Wei Huang has worked with Test Research, Inc., where he has applied his expertise in developing advanced testing methodologies. His work has been instrumental in improving testing processes and outcomes in various applications.

Collaborations

Huang has collaborated with notable colleagues, including Ming-Hsien Liu and Cheng-Yuan Chi. Their combined efforts have contributed to the success of various projects and innovations in the testing field.

Conclusion

Hsin-Wei Huang's contributions to testing systems through his patents and collaborations highlight his role as a key innovator in the industry. His work continues to influence advancements in testing methodologies and technologies.