The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2023
Filed:
Jul. 14, 2021
Applicant:
Test Research, Inc., Taipei, TW;
Inventors:
Ching-Chih Lin, Taipei, TW;
Hsin-Wei Huang, Taipei, TW;
Assignee:
Test Research, Inc., Taipei City, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/28 (2006.01); G01R 27/26 (2006.01); G01R 31/317 (2006.01); G01R 31/319 (2006.01); G01R 31/50 (2020.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 27/2605 (2013.01); G01R 31/282 (2013.01); G01R 31/2832 (2013.01); G01R 31/2834 (2013.01); G01R 31/31701 (2013.01); G01R 31/31715 (2013.01); G01R 31/31723 (2013.01); G01R 31/31907 (2013.01); G01R 31/31908 (2013.01); G01R 31/31926 (2013.01); G01R 31/50 (2020.01);
Abstract
The present disclosure provides a method of testing a single device under test (DUT) through multiple cores in parallel, which includes steps as follows. The test quantity of the DUT is calculated; the test quantity of the DUT is evenly allocated to to a plurality of test cores, so as to control a period of testing the DUT through the test cores in parallel.