Ming-Hsien Liu

Title: Innovations by Ming-Hsien Liu

Introduction

Ming-Hsien Liu is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of testing systems and methods, holding two patents that showcase his innovative approach to technology.

Latest Patents

Ming-Hsien Liu's latest patents include a "Test system and method of operating the same." This test system comprises multiple test core devices that are electrically connected to a device under test (DUT). The system features several first buses that connect these test core devices, allowing for the merging of selected test core devices into a merged test core device through the first buses. Another significant patent is the "Electrical connection defect simulation test method and system of the same." This method involves simulating electrical connection states by transmitting a zero-frequency signal to various signal pins of the DUT, enabling the performance of open and short tests on the pins.

Career Highlights

Ming-Hsien Liu works at Test Research, Inc., where he applies his expertise in developing advanced testing solutions. His work has been instrumental in enhancing the reliability and efficiency of testing systems in various applications.

Collaborations

Ming-Hsien Liu collaborates with talented coworkers, including Hsin-Wei Huang and Su-Wei Tsai, contributing to a dynamic and innovative work environment.

Conclusion

Ming-Hsien Liu's contributions to testing systems and methods reflect his dedication to innovation and excellence in technology. His patents demonstrate a commitment to improving the reliability of electrical connections, making a significant impact in his field.