Shang-Tsang Yeh

Title: Shang-Tsang Yeh: Patents in Electrical Connection Defect Detection

Introduction

Shang-Tsang Yeh is an inventor based in Zhonghe, Taiwan. His patent work includes systems and devices for detecting electrical connection defects, and he is associated with Test Research, Inc. His portfolio includes 3 patents.

Latest Patents

Yeh’s recent patents address ways to determine whether an electrical connection between a device pin and a circuit-board signal line is functioning normally.

“Electrical Connection Defect Detection System and Method” describes a system that supplies a test signal to an under-test pin and measures capacitance associated with an electrode board, the pin, and the signal line. When the connection is normal, the measured capacitance exceeds a specified threshold. The system also uses grounding paths connected to groups of pins that are not under test. The patent further describes a method for performing this defect detection.

“Electrical Connection Defect Detection Device” presents a related approach using a signal provider, a detection module, and an electrode board. The board’s detection surface contacts the device, while an array of through holes along its edges connects to ground to provide capacitive shielding. The detection module evaluates the associated capacitance against a threshold to assess whether the electrical connection is normal.

Career Highlights

Yeh’s disclosed inventions focus on electrical testing and defect detection. His work combines signal-based testing with capacitance measurement and grounding or shielding features to help identify connection problems.

Collaborations

Yeh is associated with Test Research, Inc. His listed coworkers include Su-Wei Tsai and Chia-Ming Chen.

Conclusion

Shang-Tsang Yeh’s patents describe practical approaches to detecting electrical connection defects through capacitance measurement, grounding, and shielding.