Chia-Ho Yen

Title: **Chia-Ho Yen: Innovator in Inspection Technologies**

Introduction

Chia-Ho Yen is a prominent inventor based in Taoyuan, Taiwan, recognized for his contributions to inspection technologies. With a total of two patents to his name, Yen has developed innovative methods and systems that enhance inspection processes, showcasing his expertise in the field.

Latest Patents

Yen's latest patents include a sophisticated inspection method and device. The first patent details an inspection method designed for an inspection device, where it employs optical scanning to create a scanned image of an examining target. Following this, the scanned image is reconstructed into a volume, which is then sliced in a direction adapted to produce a sliced image for thorough inspection. This method allows for the analysis of various features of the target, ultimately delivering an inspection result.

Additionally, his second patent introduces an inspection system comprising an irradiation source, an image detector, and a placement device. This placement device includes a carrier and a rotation mechanism, strategically positioned to facilitate inspection. The system allows for the coordinated movement of the irradiation source and image detector, while the carrier is designed to support one or more objects. The rotation mechanism enhances the efficiency of the inspection process by enabling precise movement.

Career Highlights

Chia-Ho Yen is associated with Test Research, Inc., where he leverages his skills in the development of cutting-edge inspection technologies. His work has positioned him as a valuable contributor to advancements in this domain, and his patents reflect his commitment to improving inspection methodologies.

Collaborations

Throughout his career, Yen has collaborated with esteemed colleagues such as Yu-Che Cheng and Shih-Liang Chen. These partnerships have further enriched his research and development endeavors, leading to innovative solutions that address the complexities of inspection processes.

Conclusion

Chia-Ho Yen stands out as an influential figure in the realm of inspection technology. His innovative approach, underscored by his patents, exemplifies the potential for technological advancements in ensuring accuracy and efficiency in inspections. His work not only benefits his company, Test Research, Inc., but also contributes significantly to the broader field of inspection technologies.