Test Research, Inc.

Chia-Ho Yen

Liang-Pin Yu

Yu-Che Cheng

Shih-Liang Chen

Chun-Ti Chen

Meng-Kun Lee

Hao-Kai Chou

Chih-Pin Chiu

An inspection method is provided herein. The inspection method is adapted for an inspection device. The inspection method includes: optically scanning an examining target for generating a scanned image; reconstructing the scanned image for a reconstructed volume; adjusting a slicing direction associated with the examining target for slicing the reconstructed volume into a sliced image; inspecting the sliced image for analyzing one or more features of the examining target; and outputting an inspection result of the examining target.

Inspection method and device

An inspection system includes an irradiation source, an image detector, and a placement device. The placement device comprises a carrier and a rotation mechanism. With respect to connections, the placement device is configured to be disposed between the irradiation source and the image detector, and the rotation mechanism is configured to be connected to the carrier. With respect to operations, the irradiation source and the image detector are driven to be moved along a predetermined path, the carrier is configured to carry at least one object, and the rotation mechanism is configured to rotate the carrier.

Inspection system and method for controlling the same

Growing community of inventors

Taoyuan, Taiwan

Chia-Ho Yen