The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Jan. 03, 2016
Applicant:
Test Research, Inc., Taipei, TW;
Inventors:
Liang-Pin Yu, Taipei, TW;
Chia-Ho Yen, Taoyuan, TW;
Hao-Kai Chou, Taichung, TW;
Chun-Ti Chen, Taipei, TW;
Meng-Kun Lee, Taipei, TW;
Assignee:
Test Research, Inc., Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 23/04 (2006.01); G01B 15/04 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); G01B 15/04 (2013.01); G01B 2210/56 (2013.01); G06K 9/00 (2013.01);
Abstract
An inspection method is provided herein. The inspection method is adapted for an inspection device. The inspection method includes: optically scanning an examining target for generating a scanned image; reconstructing the scanned image for a reconstructed volume; adjusting a slicing direction associated with the examining target for slicing the reconstructed volume into a sliced image; inspecting the sliced image for analyzing one or more features of the examining target; and outputting an inspection result of the examining target.