The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2017
Filed:
May. 17, 2013
Applicant:
Test Research, Inc., Taipei, TW;
Inventors:
Hsin-Hao Chen, Taipei, TW;
Po-Shen Kuo, Taipei, TW;
Assignee:
Test Research, Inc., Taipei, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/319 (2006.01); G01R 31/28 (2006.01); G01R 1/073 (2006.01); G01R 1/04 (2006.01); G01R 31/327 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31924 (2013.01); G01R 1/0466 (2013.01); G01R 1/07314 (2013.01); G01R 31/2879 (2013.01); G01R 31/2886 (2013.01); G01R 31/2889 (2013.01); G01R 31/327 (2013.01);
Abstract
A testing apparatus for providing per pin level setting is disclosed, and the testing apparatus includes a control unit and a filter circuit, where the control unit is electrically connected to the filter circuit. The control unit includes a field programmable gate array (FPGA) for providing a PWM signal. The filter circuit receives the PWM signal and outputs at least one DC voltage.