Hsin-Hao Chen

Title: Innovations of Hsin-Hao Chen

Introduction

Hsin-Hao Chen is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of testing apparatuses, holding a total of three patents. His work focuses on enhancing the functionality and protection of electronic devices through innovative testing solutions.

Latest Patents

Hsin-Hao Chen's latest patents include a "Testing apparatus for providing per pin level setting." This invention features a control unit and a filter circuit, where the control unit is electrically connected to the filter circuit. The control unit utilizes a field programmable gate array (FPGA) to provide a PWM signal, which the filter circuit processes to output at least one DC voltage. Another significant patent is the "Testing apparatus with backdriving protection function." This apparatus includes a driver and an FPGA, where the FPGA monitors the output current from the driver and implements a back-drive protection function to safeguard the device-under-test (DUT).

Career Highlights

Hsin-Hao Chen is currently employed at Test Research, Inc., where he applies his expertise in developing advanced testing technologies. His innovative approach has led to the creation of essential tools that enhance the reliability and safety of electronic devices.

Collaborations

Hsin-Hao Chen collaborates with talented colleagues, including Po-Shen Kuo and Su-Wei Tsai. Their combined efforts contribute to the advancement of testing technologies in the industry.

Conclusion

Hsin-Hao Chen's contributions to the field of testing apparatuses demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of electronic testing needs and provide valuable solutions for the industry.