The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
May. 17, 2013
Applicant:
Test Research, Inc., Taipei, TW;
Inventors:
Po-Shen Kuo, Taipei, TW;
Hsin-Hao Chen, Taipei, TW;
Assignee:
Test Research, Inc., Taipei, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 3/08 (2006.01); H02H 9/02 (2006.01); G01R 31/319 (2006.01); H02H 3/087 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31924 (2013.01); H02H 3/087 (2013.01);
Abstract
A testing apparatus with a back-drive protection function is disclosed, where the testing apparatus includes a driver and a field programmable gate array (FPGA), where the driver is electrically connected to the FPGA. The FPGA can monitor output current from the driver and perform the back-drive protection function on the driver to protect device-under-test (DUT).