The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

May. 27, 2024
Applicant:

Test Research, Inc., Taipei City, TW;

Inventors:

Yi Tsao, Taipei City, TW;

Hsien Hung Chen, Taipei City, TW;

Yi-Hua Pan, Taipei City, TW;

Assignee:

Test Research, Inc., Taipei City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2893 (2013.01);
Abstract

An electrical testing equipment includes a machine, a pair of conveyor rails and a first moving device. The machine has a supporting surface. The supporting surface is configured to support a fixture assembly. The conveyor rails are configured to deliver a device under test. The conveyor rails are separated from the supporting surface by a distance. The first moving device is disposed on the machine and connected with the conveyor rails. The first moving device is configured to move the conveyor rails relative to the machine to change the distance.


Find Patent Forward Citations

Tsao, Yi. (2026). Electrical testing equipment (U.S. Patent No. 12663467). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12663467

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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