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Tampa, FL, United States of America

Semiconductor Diagnostics, Inc.

USPTO Granted Patents = 13

Trademarks = 1

Forward Citations = 591

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18 inventors (with patents filed for the assignee):

Jacek J Lagowski (11 out of 23 patents)

Marshall D Wilson (7 out of 15 patents)

Alexander Savtchouk (5 out of 5 patents)

4. Piotr Edelman (4 out of 5 patents)

5. Alexandre Savtchouk (3 out of 7 patents)

6. Lubomir L Jastrzebski (3 out of 7 patents)

7. Dmitriy Marinskiy (2 out of 6 patents)

8. John D'Amico (2 out of 2 patents)

9. Andrew M Hoff (1 out of 12 patents)

10. Carlos Almeida (1 out of 4 patents)

11. Joseph Nicholas Kochey (1 out of 1 patent)

12. Nick Kochey (1 out of 1 patent)

13. Frank Gossett (1 out of 1 patent)

14. Andrei Aleinikov (1 out of 1 patent)

15. Vladimir Faifer (1 out of 1 patent)

13 patents: Sort by Forward Citations

1. 8093920 - Accurate measuring of long steady state minority carrier diffusion lengths (2012-01-10),

2. 7405580 - Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration (2008-07-29),

3. 7202691 - Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers (2007-04-10),

4. 6815974 - Determining composition of mixed dielectrics (2004-11-09),

5. 6771091 - Method and system for elevated temperature measurement with probes designed for room temperature measurement (2004-08-03),

6. 6680621 - Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current (2004-01-20),

7. 6597193 - Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current (2003-07-22),

8. 6569691 - Measurement of different mobile ion concentrations in the oxide layer of a semiconductor wafer (2003-05-27),

9. 6538462 - Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge (2003-03-25),

10. 6512384 - Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages (2003-01-28),

11. 6114865 - Device for electrically contacting a floating semiconductor wafer having (2000-09-05),

12. 6037797 - Measurement of the interface trap charge in an oxide semiconductor layer (2000-03-14),

13. 5773989 - Measurement of the mobile ion concentration in the oxide layer of a (1998-06-30),

Semiconductor Diagnostics, Inc. is a leading provider of innovative semiconductor testing solutions. We specialize in developing cutting-edge diagnostic tools for the electronics industry to ensure the quality and reliability of semiconductor devices. Our state-of-the-art equipment helps manufacturers identify and resolve defects in their products, ultimately improving performance and reducing costs. With a team of experienced engineers and technicians, we are dedicated to delivering superior testing solutions to our clients worldwide.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

13 Patents

#34 in Tampa, FL

#654 in Florida

#23,149 in US

#43,690 in the World

Tampa, FL, United States of America

Semiconductor Diagnostics, Inc.

Forward Citations = 591

18 inventors:

Jacek J Lagowski (11 out of 23 patents)

Marshall D Wilson (7 out of 15 patents)

Alexander Savtchouk (5 out of 5 patents)

4. Piotr Edelman (4 out of 5 patents)

5. Alexandre Savtchouk (3 out of 7 patents)

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