For the Inventor, By the Inventor

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Tampa, FL, United States of America

Semiconductor Diagnostics, Inc.

USPTO Granted Patents = 13

% Expired Patents = 15.4

Forward Citations = 595

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18 inventors (with patents filed for the assignee):

Jacek J Lagowski (11 out of 23 patents)

Marshall D Wilson (7 out of 15 patents)

Alexander Savtchouk (5 out of 5 patents)

4. Piotr Edelman (4 out of 5 patents)

5. Alexandre Savtchouk (3 out of 7 patents)

6. Lubomir L Jastrzebski (3 out of 7 patents)

7. Dmitriy Marinskiy (2 out of 6 patents)

8. John D'Amico (2 out of 2 patents)

9. Andrew M Hoff (1 out of 12 patents)

10. Carlos Almeida (1 out of 4 patents)

11. Joseph Nicholas Kochey (1 out of 1 patent)

12. Nick Kochey (1 out of 1 patent)

13. Frank Gossett (1 out of 1 patent)

14. Andrei Aleinikov (1 out of 1 patent)

15. Vladimir Faifer (1 out of 1 patent)

13 patents: Sort by Forward Citations

1. 8093920 - Accurate measuring of long steady state minority carrier diffusion lengths (2012-01-10),

2. 7405580 - Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration (2008-07-29),

3. 7202691 - Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers (2007-04-10),

4. 6815974 - Determining composition of mixed dielectrics (2004-11-09),

5. 6771091 - Method and system for elevated temperature measurement with probes designed for room temperature measurement (2004-08-03),

6. 6680621 - Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current (2004-01-20),

7. 6597193 - Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current (2003-07-22),

8. 6569691 - Measurement of different mobile ion concentrations in the oxide layer of a semiconductor wafer (2003-05-27),

9. 6538462 - Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge (2003-03-25),

10. 6512384 - Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages (2003-01-28),

11. 6114865 - Device for electrically contacting a floating semiconductor wafer having (2000-09-05),

12. 6037797 - Measurement of the interface trap charge in an oxide semiconductor layer (2000-03-14),

13. 5773989 - Measurement of the mobile ion concentration in the oxide layer of a (1998-06-30),

Company Overview

Semiconductor Diagnostics, Inc. is a specialized firm based in Tampa, Florida, focusing on advanced diagnostic solutions for the semiconductor industry. The company develops innovative technologies aimed at enhancing the reliability and performance of semiconductor devices. Their expertise encompasses various aspects of semiconductor manufacturing, including testing, analysis, and quality assurance, positioning them as a key player in the evolving landscape of semiconductor technology.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

13 Patents

#36 in Tampa, FL

#672 in Florida

#23,838 in US

#45,039 in the World

Tampa, FL, United States of America

Semiconductor Diagnostics, Inc.

Forward Citations = 595

18 inventors:

Jacek J Lagowski (11 out of 23 patents)

Marshall D Wilson (7 out of 15 patents)

Alexander Savtchouk (5 out of 5 patents)

4. Piotr Edelman (4 out of 5 patents)

5. Alexandre Savtchouk (3 out of 7 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Semiconductor Diagnostics, Inc.. Retrieved from https://idiyas.com/company/semiconductor-diagnostics

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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