Company Filing History:
Years Active: 2003
Title: Andrei Aleinikov: Innovator in Semiconductor Diagnostics
Introduction
Andrei Aleinikov is a notable inventor based in Tampa, FL (US), recognized for his contributions to the field of semiconductor diagnostics. With a focus on enhancing the accuracy and efficiency of semiconductor analysis, Aleinikov has made significant strides in the industry.
Latest Patents
Aleinikov holds a patent titled "Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages." This innovative method allows for the rapid and precise determination of minority carrier diffusion lengths by illuminating a semiconductor surface with a beam of light composed of multiple wavelengths, each modulated at different frequencies. The surface photovoltages induced by these light fluxes are detected simultaneously, enabling accurate calculations of minority carrier diffusion lengths.
Career Highlights
Aleinikov is associated with Semiconductor Diagnostics, Inc., where he applies his expertise in semiconductor technology. His work has contributed to advancements in the field, particularly in the methods used for analyzing semiconductor materials.
Collaborations
Throughout his career, Aleinikov has collaborated with esteemed colleagues, including Jacek J Lagowski and Vladimir Faifer. These partnerships have fostered innovation and have been instrumental in the development of new techniques in semiconductor diagnostics.
Conclusion
Andrei Aleinikov's work exemplifies the impact of innovative thinking in the semiconductor industry. His patent and collaborations highlight his commitment to advancing technology and improving diagnostic methods.