Company Filing History:
4 out of 13 
2 out of 1,935 
1 out of 1 Years Active: 1997-2007
Title: Piotr Edelman: Innovator in Semiconductor Technology
Introduction
Piotr Edelman is a notable inventor based in Tampa, FL, who has made significant contributions to the field of semiconductor technology. With a total of 5 patents to his name, he has developed innovative methods that enhance the accuracy and efficiency of semiconductor testing.
Latest Patents
One of his latest patents is a non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers. This method allows for the accurate measurement of charge-voltage data on test sites smaller than 100 µm by recognizing and aligning the designated test site, depositing a prescribed dose of ionic charge, and measuring the resulting voltage change without contacting the wafer surface. This innovation ensures that the wafer remains uncontaminated and can be returned to the IC fabrication line for further processing.
Another significant patent involves a method and system for elevated temperature measurement using probes designed for room temperature measurement. This technique prevents probe damage from excessive heating by minimizing the time the probe is near the heated sample. Additionally, it includes a correction mechanism for the probe readings by measuring a reference plate at room temperature during the measurement cycle.
Career Highlights
Throughout his career, Piotr Edelman has worked with notable organizations such as Semiconductor Diagnostics, Inc. and the University of South Florida. His work has focused on advancing semiconductor diagnostics and measurement techniques, contributing to the efficiency of semiconductor manufacturing processes.
Collaborations
He has collaborated with esteemed colleagues, including Jacek J Lagowski and Lubek Jastrzebski, further enhancing the impact of his work in the semiconductor field.
Conclusion
Piotr Edelman's innovative contributions to semiconductor technology through his patents and collaborations have significantly advanced the industry. His work continues to influence the development of efficient testing methods in semiconductor manufacturing.