Nick Kochey

Title: Nick Kochey: Innovator in Elevated Temperature Measurement

Introduction

Nick Kochey is an accomplished inventor based in St. Petersburg, FL (US). He has made significant contributions to the field of temperature measurement, particularly through his innovative patent. His work focuses on enhancing the accuracy and safety of measuring elevated temperatures using specialized probes.

Latest Patents

Kochey's most notable patent is titled "Method and system for elevated temperature measurement with probes designed for room temperature measurement." This invention discloses techniques for measuring a contact potential difference of a sample at an elevated temperature while using a probe that is typically designed for room temperature measurement. The patent addresses the challenge of preventing probe damage due to excessive heating without requiring modifications for probe cooling. By minimizing the time the probe is in close proximity to the heated sample, Kochey’s method ensures the integrity of the probe. Additionally, the invention includes a correction mechanism for the effect of probe heating on the readings by incorporating a measurement of a reference plate maintained at room temperature.

Career Highlights

Kochey is currently employed at Semiconductor Diagnostics, Inc., where he applies his expertise in temperature measurement technologies. His innovative approach has positioned him as a valuable asset in the semiconductor industry.

Collaborations

Throughout his career, Kochey has collaborated with notable colleagues, including Jacek J Lagowski and Piotr Edelman. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Nick Kochey is a pioneering inventor whose work in elevated temperature measurement has the potential to significantly impact various industries. His innovative patent reflects his commitment to advancing technology in a safe and effective manner.