St. Petersburg, FL, United States of America

Joseph Nicholas Kochey


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Joseph Nicholas Kochey: Innovator in Semiconductor Testing

Introduction

Joseph Nicholas Kochey is a notable inventor based in St. Petersburg, FL (US). He has made significant contributions to the field of semiconductor diagnostics, particularly through his innovative patent that enhances the accuracy of charge-voltage data acquisition on semiconductor wafers.

Latest Patents

Kochey's most recent patent is titled "Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers." This patent describes a non-contact method for obtaining precise charge-voltage data on miniature test sites of semiconductor wafers, which are smaller than 100 µm by 100 µm. The method involves recognizing the designated test site, aligning it accurately, depositing a specific dose of ionic charge on the surface, and measuring the resulting voltage change. Notably, this method allows for voltage measurements in both dark and illuminated conditions without interference from the laser beam used in Kelvin Force probe measurements. This innovative approach enables the acquisition of charge-voltage data without contacting or contaminating the wafer, allowing it to be returned to the integrated circuit fabrication line for further processing. Kochey holds 1 patent for this groundbreaking work.

Career Highlights

Joseph Nicholas Kochey is associated with Semiconductor Diagnostics, Inc., where he applies his expertise in semiconductor testing. His work has been instrumental in advancing the methodologies used in the industry, particularly in non-contact testing techniques.

Collaborations

Kochey has collaborated with notable colleagues, including Jacek J Lagowski and Piotr Edelman, contributing to the development of innovative solutions in semiconductor diagnostics.

Conclusion

Joseph Nicholas Kochey is a distinguished inventor whose contributions to semiconductor testing have paved the way for more efficient and contamination-free methodologies. His innovative patent reflects his commitment to advancing technology in the semiconductor industry.

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