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San Jose, CA, United States of America

N K Technology Ltd

USPTO Granted Patents = 40

% Expired Patents = 35.0

EPO Patents = 1

Trademarks = 2

Forward Citations = 457

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24 inventors (with patents filed for the assignee):

Abdul Rahim Forouhi (19 out of 20 patents)

Guoguang Li (16 out of 19 patents)

Marc T Aho (9 out of 9 patents)

4. Dale Buermann (8 out of 54 patents)

5. Shuqiang Chen (6 out of 6 patents)

6. Dale A Harrison (5 out of 6 patents)

7. Daniel Tran (4 out of 8 patents)

8. Michael J Mandella (4 out of 53 patents)

9. Phillip Walsh (4 out of 4 patents)

10. Thaddeus J Wilson (3 out of 3 patents)

11. Jeff Roberts (3 out of 3 patents)

12. John C Lam (3 out of 3 patents)

13. Mehdi Balooch (2 out of 18 patents)

14. Hongwei Zhu (2 out of 7 patents)

15. Ray Hebert (2 out of 3 patents)

Core Competencies:

Optical Metrology

Wafer Handling

Spectroscopy

Photomask Inspection

Diffraction Analysis

Grating Characterization

Thin-Film Processes

Reflectance Spectroscopy

Chromatic Dispersion

Pattern Feature Parameters

Wafer Calibration

Particle Size Measurement

40 patents: Sort by Forward Citations

1. 9513112 - Three dimensional characterization of silicon wafer Vias from combined on-top microscopic and bottom-through laser fringes measurement (2016-12-06),

2. 8125641 - Method and apparatus for phase-compensated sensitivity-enhanced spectroscopy (PCSES) (2012-02-28),

3. 7999936 - Combined transmittance and angle selective scattering measurement of fluid suspended particles for simultaneous determination of refractive index, extinction coefficient, particle size and particle density (2011-08-16),

4. 7962242 - Automated spatial flipping apparatus and system for photomasks and photomasks with pellicles (2011-06-14),

5. 7756677 - Implementation of rigorous coupled wave analysis having improved efficiency for characterization (2010-07-13),

6. 7755775 - Broadband optical metrology with reduced wave front distortion, chromatic dispersion compensation and monitoring (2010-07-13),

7. 7717661 - Compact multiple diameters wafer handling system with on-chuck wafer calibration and integrated cassette-chuck transfer (2010-05-18),

8. 7679736 - System and method for optical photomask inspection through pellicle (2010-03-16),

9. 7616301 - Disc clamping device for multiple standard discs (2009-11-10),

10. 7525672 - Efficient characterization of symmetrically illuminated symmetric 2-D gratings (2009-04-28),

11. 7505147 - Efficient calculation of grating matrix elements for 2-D diffraction (2009-03-17),

12. 7397554 - Apparatus and method for examining a disk-shaped sample on an X-Y-theta stage (2008-07-08),

13. 7397030 - Integrated local and global optical metrology for samples having miniature features (2008-07-08),

14. 7391524 - System and method for efficient characterization of diffracting structures with incident plane parallel to grating lines (2008-06-24),

15. 7349103 - System and method for high intensity small spot optical metrology (2008-03-25),

Company Overview

N K Technology Ltd, based in San Jose, CA, specializes in advanced optical metrology solutions, focusing on precision measurement and inspection technologies. The company is recognized for its expertise in photomask inspection and wafer handling, catering to the semiconductor industry. Their innovative approaches encompass spectroscopy, diffraction gratings, and thin-film processes, enhancing the accuracy and efficiency of optical measurements. N K Technology Ltd is committed to advancing metrology techniques that support the evolving needs of high-tech manufacturing.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

40 Patents

#218 in San Jose, CA

#2,035 in California

#8,618 in US

#17,048 in the World

San Jose, CA, United States of America

N K Technology Ltd

Forward Citations = 457

24 inventors:

Abdul Rahim Forouhi (19 out of 20 patents)

Guoguang Li (16 out of 19 patents)

Marc T Aho (9 out of 9 patents)

4. Dale Buermann (8 out of 54 patents)

5. Shuqiang Chen (6 out of 6 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: N K Technology Ltd. Retrieved from https://idiyas.com/company/n-k-technology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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