For the Inventor, By the Inventor

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San Jose, CA, United States of America

N K Technology Ltd

USPTO Granted Patents = 40

% Expired Patents = 35.0

EPO Patents = 1

Trademarks = 2

Forward Citations = 457

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24 inventors (with patents filed for the assignee):

Abdul Rahim Forouhi (19 out of 20 patents)

Guoguang Li (16 out of 19 patents)

Marc T Aho (9 out of 9 patents)

4. Dale Buermann (8 out of 54 patents)

5. Shuqiang Chen (6 out of 6 patents)

6. Dale A Harrison (5 out of 6 patents)

7. Daniel Tran (4 out of 8 patents)

8. Michael J Mandella (4 out of 53 patents)

9. Phillip Walsh (4 out of 4 patents)

10. Thaddeus J Wilson (3 out of 3 patents)

11. Jeff Roberts (3 out of 3 patents)

12. John C Lam (3 out of 3 patents)

13. Mehdi Balooch (2 out of 18 patents)

14. Hongwei Zhu (2 out of 7 patents)

15. Ray Hebert (2 out of 3 patents)

Core Competencies:

Optical Metrology

Photomask Inspection

Wafer Handling

Spectroscopy

Diffraction Gratings

Thin-Film Processes

Reflectance Spectroscopy

Laser Fringes Measurement

Particle Size Analysis

Chromatic Dispersion Compensation

Optical Characterization

Automated Spatial Flipping

40 patents: Sort by Forward Citations

1. 9513112 - Three dimensional characterization of silicon wafer Vias from combined on-top microscopic and bottom-through laser fringes measurement (2016-12-06),

2. 8125641 - Method and apparatus for phase-compensated sensitivity-enhanced spectroscopy (PCSES) (2012-02-28),

3. 7999936 - Combined transmittance and angle selective scattering measurement of fluid suspended particles for simultaneous determination of refractive index, extinction coefficient, particle size and particle density (2011-08-16),

4. 7962242 - Automated spatial flipping apparatus and system for photomasks and photomasks with pellicles (2011-06-14),

5. 7756677 - Implementation of rigorous coupled wave analysis having improved efficiency for characterization (2010-07-13),

6. 7755775 - Broadband optical metrology with reduced wave front distortion, chromatic dispersion compensation and monitoring (2010-07-13),

7. 7717661 - Compact multiple diameters wafer handling system with on-chuck wafer calibration and integrated cassette-chuck transfer (2010-05-18),

8. 7679736 - System and method for optical photomask inspection through pellicle (2010-03-16),

9. 7616301 - Disc clamping device for multiple standard discs (2009-11-10),

10. 7525672 - Efficient characterization of symmetrically illuminated symmetric 2-D gratings (2009-04-28),

11. 7505147 - Efficient calculation of grating matrix elements for 2-D diffraction (2009-03-17),

12. 7397554 - Apparatus and method for examining a disk-shaped sample on an X-Y-theta stage (2008-07-08),

13. 7397030 - Integrated local and global optical metrology for samples having miniature features (2008-07-08),

14. 7391524 - System and method for efficient characterization of diffracting structures with incident plane parallel to grating lines (2008-06-24),

15. 7349103 - System and method for high intensity small spot optical metrology (2008-03-25),

Company Badge

USPTO Data Jan 1 1976 - Sep 15 2026

N K Technology Ltd

40 Patents

#218 in San Jose, CA

#2,029 in California

#8,603 in US

#17,008 in the World

San Jose, CA, United States of America

N K Technology Ltd

Forward Citations = 457

24 inventors:

Abdul Rahim Forouhi (19 out of 20 patents)

Guoguang Li (16 out of 19 patents)

Marc T Aho (9 out of 9 patents)

4. Dale Buermann (8 out of 54 patents)

5. Shuqiang Chen (6 out of 6 patents)

Please report any incorrect information to [email protected]

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