Abdul Rahim Forouhi

This inventor holds 20 USPTO granted patents, primarily in Optical Metrology. Top assignees: N K Technology Ltd, Nsh Technology, Inc.. Active years: 1999-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Abdul Rahim Forouhi. Retrieved from https://idiyas.com/inventor/abdul-rahim-forouhi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 20

% Patents Active = 90.0

Average Co-Inventor Count = 3.1

ph-index = 10

Forward Citations = 348(Granted Patents)

Company Filing History:

Years Active: 1999-2011

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Areas of Expertise:

Optical Metrology

Spectrophotometry

Phase Shift Measurement

Thin-Film Processes

Reflectance Spectroscopy

Miniature Features

Graded Anti-Reflective Coatings

Optical Characterization

Diffraction Gratings

Non-Destructive Monitoring

Ion Implantation

Transmittance Spectra

20 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7999936 - Combined transmittance and angle selective scattering measurement of fluid suspended particles for simultaneous determination of refractive index, extinction coefficient, particle size and particle density (2011-08-16),

2. 7397030 - Integrated local and global optical metrology for samples having miniature features (2008-07-08),

3. 7349103 - System and method for high intensity small spot optical metrology (2008-03-25),

4. 7330256 - Spectrophotometric system with reduced angle of incidence (2008-02-12),

5. 7327457 - Apparatus and method for optical characterization of a sample over a broadband of wavelengths while minimizing polarization changes (2008-02-05),

6. 7289214 - System and method for measuring overlay alignment using diffraction gratings (2007-10-30),

7. 7253909 - Phase shift measurement using transmittance spectra (2007-08-07),

8. 7248364 - Apparatus and method for optical characterization of a sample over a broadband of wavelengths with a small spot size (2007-07-24),

9. 6891628 - Method and apparatus for examining features on semi-transparent and transparent substrates (2005-05-10),

10. 6825933 - Computer-implemented reflectance system and method for non-destructive low dose ion implantation monitoring (2004-11-30),

11. 6710865 - Method of inferring optical parameters outside of a measurement spectral range (2004-03-23),

12. 6594025 - Method of monitoring thin-film processes and metrology tool thereof (2003-07-15),

13. 6392756 - Method and apparatus for optically determining physical parameters of thin films deposited on a complex substrate (2002-05-21),

14. 6379014 - Graded anti-reflective coatings for photolithography (2002-04-30),

15. 6327035 - Method and apparatus for optically examining miniature patterns (2001-12-04),

Title: **Inventor Spotlight: Abdul Rahim Forouhi**

Introduction

Abdul Rahim Forouhi is a notable inventor based in Cupertino, California, contributing significantly to optical measurement technologies. With a remarkable portfolio comprising 20 patents, his work primarily focuses on innovative methods for determining key properties of fluid suspended particles.

Latest Patents

Forouhi's latest inventions include groundbreaking advancements in optical measurement techniques. One of his notable patents is titled "Combined transmittance and angle selective scattering measurement of fluid suspended particles for simultaneous determination of refractive index, extinction coefficient, particle size and particle density." This invention allows for the simultaneous determination of these critical properties using a combination of transmittance and scattering measurements, utilizing advanced components like a charge-coupled device for high sensitivity.

Another significant patent is "Integrated local and global optical metrology for samples having miniature features," which introduces an apparatus for integrated measurement of minuscule samples. This innovative apparatus features an optical measuring unit capable of illuminating samples and obtaining optical responses, alongside a local measuring unit for high-precision measurements at the nanometer scale.

Career Highlights

Abdul Rahim Forouhi has had a distinguished career, marked by his tenure at esteemed companies such as N&K Technology, Inc. and NSH Technology, Inc. His contributions in these organizations have been pivotal in advancing the field of optical measurement and analysis.

Collaborations

Throughout his career, Forouhi has worked alongside notable colleagues, including Guoguang Li and Dale A. Harrison. Their collaborative efforts have undoubtedly enriched the research environment and contributed to the success of various projects.

Conclusion

Abdul Rahim Forouhi has established himself as a leading inventor in the field of optical sciences. His innovative patents and collaborations reflect a deep commitment to advancing measurement technologies, with potential applications that can significantly impact various industries. As he continues to develop new ideas, the future of optical measurement looks promising.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]