Phillip Walsh

Title: The Innovative Contributions of Phillip Walsh

Introduction

Phillip Walsh is a notable inventor based in San Jose, California. He has made significant contributions to the field of optical metrology, holding a total of four patents. His work focuses on advanced methods and systems for examining features of samples using innovative optical techniques.

Latest Patents

Phillip Walsh's latest patents include a "System and method for high intensity small spot optical metrology." This invention describes an apparatus and method for examining features of a sample with a broadband beam of light obtained from a long-wavelength source. The system includes two distinct emitters that emit long-wavelength and short-wavelength radiation. A reflective beam combining optics is utilized to shape the long-wavelength radiation to enter the short-wavelength source and to shape the short-wavelength radiation that exits toward the long-wavelength source. The broadband beam is projected onto a sample, and the scattered broadband radiation is shaped into a signal beam for optical examination.

Another significant patent is the "Phase shift measurement using transmittance spectra." This invention provides an apparatus and method for determining physical parameters of features on a substrate by illuminating it with incident light across a specific wavelength range. The response light from the substrate is measured to obtain a response spectrum, which is then used to compute a complex-valued response. This method allows for direct approximate phase measurement when the response light is transmitted light.

Career Highlights

Phillip Walsh is currently employed at N&K Technology, Inc., where he continues to develop innovative optical technologies. His work has been instrumental in advancing the field of optical metrology, contributing to more precise measurements and analyses.

Collaborations

Phillip has collaborated with notable colleagues such as Guoguang Li and Abdul Rahim Forouhi. Their combined expertise has further enhanced the research and development efforts at N&K Technology, Inc.

Conclusion

Phillip Walsh's contributions to optical metrology through his innovative patents and collaborative efforts highlight his significant role in advancing technology in this field. His work continues to influence the way optical measurements are conducted, paving the way for future innovations.