John C Lam

Title: Innovations of John C. Lam

Introduction

John C. Lam is a notable inventor based in San Jose, California. He has made significant contributions to the field of optical measurement and characterization, holding three patents to his name. His work primarily focuses on advancing technologies that enhance the understanding and measurement of optical parameters in various materials.

Latest Patents

One of his latest patents is titled "Three dimensional characterization of silicon wafer Vias from combined on-top microscopic and bottom-through laser fringes measurement." This invention involves directing a collimated laser beam towards the bottom of a silicon wafer, allowing for the characterization of vias through the analysis of concentric laser interference fringes. Another significant patent is "Method of inferring optical parameters outside of a measurement spectral range." This method utilizes known optical parameters within a predetermined spectral range to predict values in a different range, leveraging the Forouhi-Bloomer dispersion equations.

Career Highlights

John C. Lam is currently employed at N&K Technology, Inc., where he continues to innovate and develop new technologies. His expertise in optical measurement has positioned him as a key figure in his field, contributing to advancements that benefit various industries.

Collaborations

Throughout his career, John has collaborated with esteemed colleagues such as Abdul Rahim Forouhi and Dale A. Harrison. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

John C. Lam's contributions to optical measurement and characterization demonstrate his commitment to innovation in technology. His patents reflect a deep understanding of optical principles and their applications, solidifying his reputation as a leading inventor in his field.