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Amagasaki, Japan

Japan Electronic Materials Corporation

USPTO Granted Patents = 35

% Expired Patents = 14.3

Forward Citations = 185

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51 inventors (with patents filed for the assignee):

Chikaomi Mori (10 out of 13 patents)

Kosuke Fujihara (6 out of 8 patents)

Masao Okubo (5 out of 19 patents)

4. Zenji Hagiwara (5 out of 15 patents)

5. Yuichiro Shimizu (4 out of 12 patents)

6. Teppei Kimura (4 out of 8 patents)

7. Takashi Amemiya (3 out of 13 patents)

8. Katsuhiko Satou (3 out of 3 patents)

9. Liwen Fan (2 out of 2 patents)

10. Akinori Shiraishi (2 out of 66 patents)

11. Atsuo Urata (2 out of 6 patents)

12. Hiroshi Yamazaki (1 out of 105 patents)

13. Hiroshi Iwata (1 out of 11 patents)

14. Katsunori Yamagishi (1 out of 2 patents)

15. Koji Nagai (1 out of 2 patents)

Core Competencies:

Probe Card

Composite Probe

Alignment Chip

Probe Guide Plate

Bimetallic Probe

Antimicrobial Composition

Semiconductor Test

Optical Device Inspection

Multilayer Wiring Substrate

Probe Passing Method

Repair Method

Contact Probe

35 patents: Sort by Forward Citations

1. 12736561 - Probe pin and probe card (2026-09-15),

2. 12681047 - Composite probe, method for attaching probe, and method for manufacturing probe card (2026-07-14),

3. 12681046 - Probe passing method and probe (2026-07-14),

4. 12625165 - Probe card (2026-05-12),

5. 12596147 - Alignment chip for probe card, probe card and probe card repair method (2026-04-07),

6. 12546803 - Probe-card multilayer wiring substrate and probe card (2026-02-10),

7. 12467953 - Probe card (2025-11-11),

8. 12392801 - Probe card (2025-08-19),

9. 12339314 - Probe card and method for repairing probe card (2025-06-24),

10. 12332278 - Probe card (2025-06-17),

11. 10908180 - Probe card case and probe card transfer method (2021-02-02),

12. 10386387 - Probe guide plate and probe device (2019-08-20),

13. 10309988 - Probe guide plate and probe device (2019-06-04),

14. 10261110 - Probe guide plate having a silicon oxide layer formed on surfaces and on an inner wall of a through hole thereof, and a protective insulating layer formed on the silicon oxide layer, and probe apparatus including the probe guide plate (2019-04-16),

15. 10184954 - Probe card case and probe card transfer method (2019-01-22),

Japan Electronic Materials Corporation is a prominent player in the development and manufacturing of advanced electronic materials. The company specializes in producing high-quality materials essential for various applications in the electronics industry, including semiconductors and display technologies. With a strong focus on innovation, Japan Electronic Materials Corporation engages in extensive research to enhance material performance and meet the evolving demands of global markets, particularly in the Asia-Pacific region.

Profile summary based on public USPTO records.

Company Badge

USPTO Data Jan 1 1976 - Sep 29 2026

35 Patents

#4 in Amagasaki

#2,128 in Japan

#19,137 in the World

Amagasaki, Japan

Japan Electronic Materials Corporation

Forward Citations = 185

51 inventors:

Chikaomi Mori (10 out of 13 patents)

Kosuke Fujihara (6 out of 8 patents)

Masao Okubo (5 out of 19 patents)

4. Zenji Hagiwara (5 out of 15 patents)

5. Yuichiro Shimizu (4 out of 12 patents)

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