The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Sep. 15, 2020
Japan Electronic Materials Corporation, Hyogo, JP;
Chikaomi Mori, Hyogo, JP;
JAPAN ELECTRONIC MATERIALS CORPORATION, Hyogo, JP;
Abstract
An object is to provide a probe card that enables probes to be arranged at a narrow pitch while causing the probes being inserted through guide holes of a guide plate to be locked to the guide plate so as not to fall out. Two or more probesand a first guide plateincluding two or more first guide holesthrough which the probesare inserted, respectively, are provided. The probeis arranged so as to be inclined with respect to the first guide plate, and has a locking portionformed by causing a side surfaceon a first direction dside, which is a side surface above the first guide plateand has an acute angle with respect to the first guide plate, to protrude, and an offset portionformed by offsetting a side surfaceon a second direction dside, which is a side surface above the first guide plateand has an obtuse angle with respect to the first guide plate, to the locking portion side. A pair of the probes, adjacent to each other, is arranged such that the locking portionof one of the pair opposes the offset portionof the other.