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For the Inventor, By the Inventor

Hyogo, Japan

Chikaomi Mori

USPTO Granted Patents = 12 

Average Co-Inventor Count = 1.8

ph-index = 4

Forward Citations = 50(Granted Patents)


Location History:

  • Yamaga, JP (2004 - 2007)
  • Amagasaki, JP (2016 - 2019)
  • Hyogo, JP (2006 - 2021)

Company Filing History:

goldMedal9 out of 29 
 
Japan Electronic Materials Corporation
 patents
silverMedal3 out of 17 
 
Nihon Denshizairyo Kabushiki Kaisha
 patents
bronzeMedal2 out of 1,694 
 
Shinko Electric Industries Co., Ltd.
 patents
where one patent can have more than one assignee

Years Active: 2004-2025

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12 patents (USPTO):Explore Patents
1. 12332278 - Probe card (2025-06-17),
2. 10908180 - Probe card case and probe card transfer method (2021-02-02),
3. 10261110 - Probe guide plate having a silicon oxide layer formed on surfaces and on an inner wall of a through hole thereof, and a protective insulating layer formed on the silicon oxide layer, and probe apparatus including the probe guide plate (2019-04-16),
4. 10184954 - Probe card case and probe card transfer method (2019-01-22),
5. 10139430 - Probe guide, probe card, and method for probe guide manufacturing (2018-11-27),
6. D751555 - Probe card case (2016-03-15),
7. 7307435 - Probe card (2007-12-11),
8. 7106080 - Probe card and contactor of the same (2006-09-12),
9. 7081766 - Probe card for examining semiconductor devices on semiconductor wafers (2006-07-25),
10. 7075319 - Probe card having a coil spring interposed between a support member and a contactor unit (2006-07-11),
11. 6967493 - Probe card and contactor of the same (2005-11-22),
12. 6836024 - Apparatus for connecting between substrates (2004-12-28),

Title: Innovations of Chikaomi Mori

Introduction

Chikaomi Mori is a notable inventor based in Hyogo, Japan, recognized for his contributions to the field of electronic materials. With a total of 12 patents to his name, Mori has made significant advancements in probe card technology, which is essential for semiconductor testing.

Latest Patents

Mori's latest patents include a novel probe card design aimed at improving the arrangement of probes. The invention provides a mechanism that allows probes to be positioned at a narrow pitch while ensuring they remain securely locked within guide holes of a guide plate. This design features two or more probes and a first guide plate with multiple first guide holes. The probes are inclined relative to the guide plate, incorporating a locking portion that prevents them from falling out. Additionally, he has developed a probe card case that facilitates the safe transfer of probe cards, ensuring they are securely mounted and fixed during transportation.

Career Highlights

Throughout his career, Chikaomi Mori has worked with prominent companies in the electronics sector, including Japan Electronic Materials Corporation and Nihon Denshizairyo Kabushiki Kaisha. His work has significantly impacted the efficiency and reliability of semiconductor testing processes.

Collaborations

Mori has collaborated with notable colleagues such as Katsuhiko Satou and Takashi Amemiya, contributing to the advancement of technology in their field.

Conclusion

Chikaomi Mori's innovative work in probe card technology has established him as a key figure in the electronics industry. His patents reflect a commitment to enhancing the efficiency of semiconductor testing, showcasing his expertise and dedication to innovation.

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