Katsuhiko Satou

Title: Innovations by Katsuhiko Satou in Semiconductor Technology

Introduction

Katsuhiko Satou is a prominent inventor based in Yokohama, Japan, known for his contributions to semiconductor technology. He holds three patents that showcase his innovative approach to enhancing the performance and reliability of semiconductor devices.

Latest Patents

One of his latest patents is a probe card and contactor designed for measuring the electrical characteristics of semiconductor devices, such as LSI chips. This probe card features a contactor mounting substrate with multiple contactors, each equipped with an insertion part for easy mounting. The design includes a support part that ensures proper positioning and an arm part that extends to make contact with the device under test. The insertion part is detachable and conductive, enhancing usability.

Another significant patent involves a probe card for examining semiconductor devices on wafers. This invention allows for easy assembly and disassembly of the probe card components, minimizing the risk of electrical conduction failures. It includes a space transformer with multiple contacts and connecting pins, ensuring high reliability and effective measurement of electrical properties.

Career Highlights

Katsuhiko Satou is currently employed at Japan Electronic Materials Corporation, where he continues to develop innovative solutions in the field of semiconductor technology. His work has significantly impacted the efficiency and reliability of semiconductor testing processes.

Collaborations

He collaborates with notable colleagues, including Chikaomi Mori and Masanari Nakashima, contributing to advancements in their shared field of expertise.

Conclusion

Katsuhiko Satou's innovative patents and contributions to semiconductor technology highlight his role as a key figure in the industry. His work continues to influence the development of reliable and efficient testing methods for semiconductor devices.