The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Apr. 23, 2021
Japan Electronic Materials Corporation, Hyogo, JP;
Yutaka Tomita, Hyogo, JP;
JAPAN ELECTRONIC MATERIALS CORPORATION, Hyogo, JP;
Abstract
The purpose of the present invention is to provide a method for repairing a probe card in which a defect has occurred in an alignment symbol or a peripheral region thereof by using a high reflection chip for alignment. The present invention is provided with a probefor contacting an inspection object, a wiring substrateto which the probeis attached, and a high reflection chipfor alignment provided to a probe installation surfaceof the wiring substrate. The high reflection chipincludes a metal plate having a fixing through-hole, and has an affixing surface to be attached to the probe installation surfacewith an adhesiveand a mirror-finished high reflection surface on the other side from the affixing surface. The adhesiveformed on the affixing surface has a ridgethat extends into the fixing through-hole