Amagasaki, Japan

Teppei Kimura


Average Co-Inventor Count = 3.1

ph-index = 3

Forward Citations = 32(Granted Patents)


Location History:

  • Kobe, JP (2005 - 2007)
  • Amagasaki, JP (2016 - 2017)
  • Hyogo, JP (2017 - 2018)

Company Filing History:


Years Active: 2005-2018

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8 patents (USPTO):Explore Patents

Title: Teppei Kimura: Innovator in Probe Technology

Introduction

Teppei Kimura is a notable inventor based in Amagasaki, Japan. He has made significant contributions to the field of probe technology, holding a total of eight patents. His innovative designs aim to enhance the efficiency and effectiveness of contact probes and guide plates used in various applications.

Latest Patents

Among his latest patents, Teppei Kimura has developed a contact probe designed to minimize interference with guide plates during operation. This invention features a stacked structure that includes an intermediate metallic layer sandwiched between outer metallic layers. The contact part of the probe is designed to abut against a test object, while an elastic deformation part allows for movement in a predetermined direction. Additionally, he has created a guide plate for probe cards that boasts fine through holes at tight pitches, enhancing strength and functionality.

Career Highlights

Teppei Kimura has worked with prominent companies in the electronics sector, including Japan Electronic Materials Corporation and Nihon Denshizairyo Kabushiki Kaisha. His experience in these organizations has contributed to his expertise in developing advanced probe technologies.

Collaborations

Throughout his career, Teppei has collaborated with notable colleagues such as Atsuo Urata and Kazumichi Machida. These partnerships have fostered innovation and the sharing of ideas in the field of probe technology.

Conclusion

Teppei Kimura's contributions to probe technology through his patents and collaborations highlight his role as a significant inventor in the industry. His work continues to influence advancements in electronic testing and measurement.

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