This inventor holds 8 USPTO granted patents. Top assignees: Japan Electronic Materials Corporation, Nihon Denshizairyo Kabushiki Kaisha, Japan Electronics Material Corporation. Active years: 2005-2018.
Location History:
- Kobe, JP (2005 - 2007)
- Amagasaki, JP (2016 - 2017)
- Hyogo, JP (2017 - 2018)
Company Filing History:
4 out of 35 
3 out of 17 
1 out of 1 Years Active: 2005-2018
Title: Teppei Kimura: Innovator in Probe Technology
Introduction
Teppei Kimura is a notable inventor based in Amagasaki, Japan. He has made significant contributions to the field of probe technology, holding a total of eight patents. His innovative designs aim to enhance the efficiency and effectiveness of contact probes and guide plates used in various applications.
Latest Patents
Among his latest patents, Teppei Kimura has developed a contact probe designed to minimize interference with guide plates during operation. This invention features a stacked structure that includes an intermediate metallic layer sandwiched between outer metallic layers. The contact part of the probe is designed to abut against a test object, while an elastic deformation part allows for movement in a predetermined direction. Additionally, he has created a guide plate for probe cards that boasts fine through holes at tight pitches, enhancing strength and functionality.
Career Highlights
Teppei Kimura has worked with prominent companies in the electronics sector, including Japan Electronic Materials Corporation and Nihon Denshizairyo Kabushiki Kaisha. His experience in these organizations has contributed to his expertise in developing advanced probe technologies.
Collaborations
Throughout his career, Teppei has collaborated with notable colleagues such as Atsuo Urata and Kazumichi Machida. These partnerships have fostered innovation and the sharing of ideas in the field of probe technology.
Conclusion
Teppei Kimura's contributions to probe technology through his patents and collaborations highlight his role as a significant inventor in the industry. His work continues to influence advancements in electronic testing and measurement.