The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
May. 05, 2004
Atsushi Mine, Arao, JP;
Toranosuke Furusho, Arao, JP;
Kazumichi Machida, Takarazuka, JP;
Atsuo Urata, Ibaraki, JP;
Teppei Kimura, Kobe, JP;
Teruhisa Sakata, Kikuchi-gun, JP;
Atsushi Mine, Arao, JP;
Toranosuke Furusho, Arao, JP;
Kazumichi Machida, Takarazuka, JP;
Atsuo Urata, Ibaraki, JP;
Teppei Kimura, Kobe, JP;
Teruhisa Sakata, Kikuchi-gun, JP;
Nihon Denshizairyo Kabushiki Kaisha, Amagasaki-Shi, JP;
Abstract
It is an object of the present invention to provide an arch type probe capable of enduring a load caused by overdriving even if the probe is miniaturized, and a probe card using the same. An arch type probehas a shape including a first quarter circle arc portionwhich is supported at one end thereof by the base plateand a second quarter circle arc portionwhich is connected to the other end of the first quarter circle arc portionextending toward the base plate and a little shorter than the first quarter circle arc portionThe top portion of the arch type probeserves as a contact surface brought into contact with an electrode of a semiconductor water B.