Kikuchi-gun, Japan

Teruhisa Sakata


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Teruhisa Sakata: Innovator in Probe Card Technology

Introduction

Teruhisa Sakata is a notable inventor based in Kikuchi-gun, Japan. He has made significant contributions to the field of semiconductor technology, particularly through his innovative designs in probe cards. His work focuses on enhancing the performance and durability of these essential tools in the semiconductor manufacturing process.

Latest Patents

Sakata holds a patent for a unique probe card design. This invention aims to provide an arch type probe capable of enduring loads caused by overdriving, even when miniaturized. The design features a first quarter circle arc portion supported by a base plate and a second quarter circle arc portion that connects to the first, extending toward the base plate. The top portion of the arch type probe serves as a contact surface that interacts with the electrode of a semiconductor.

Career Highlights

Throughout his career, Teruhisa Sakata has been associated with Nihon Denshizairyo Kabushiki Kaisha, where he has contributed to various projects and innovations. His expertise in probe card technology has positioned him as a key figure in the semiconductor industry.

Collaborations

Sakata has worked alongside talented colleagues, including Atsushi Mine and Toranosuke Furusho. Their collaborative efforts have further advanced the development of innovative technologies in their field.

Conclusion

Teruhisa Sakata's contributions to probe card technology exemplify his commitment to innovation in the semiconductor industry. His patent reflects a significant advancement that enhances the reliability and efficiency of semiconductor testing processes.

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