The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2018
Filed:
Aug. 11, 2017
Japan Electronic Materials Corporation, Hyogo, JP;
Teppei Kimura, Hyogo, JP;
Noriyuki Fukushima, Hyogo, JP;
Atsuo Urata, Hyogo, JP;
Naoki Arita, Hyogo, JP;
Tomoyuki Takeda, Hyogo, JP;
Japan Electronic Materials Corporation, Hyogo, JP;
Abstract
The present invention intends to suppress a contact probe from interfering with a guide plate to produce shavings. The present invention has stacked structure that sandwiches an intermediate metallic layerbetween outer metallic layersand, and includes: a contact partthat is brought into abutting with a test object; an elastic deformation partthat is elastically deformed so as to be curved in a predetermine direction of curvature N by compression force in the longer direction; and a fore end partthat is formed between the contact partand the elastic deformation partand supported by a through-holeof a guide plateso as to make the contact partmovable in the longer direction, in which side surfaces of the fore end partformed in the direction of curvature N and a direction N' opposite to the N of the elastic deformation partare configured to include the three metallic layersto, and on the side surfaces, the intermediate metallic layeris configured to protrude relative to the outer metallic layersand