Zhaohui Cheng

This inventor holds 24 USPTO granted patents and 1 published patent application. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation, Hitachi, Ltd.. Active years: 2005-2025.

USPTO Granted Patents = 24 (Patent Applications = 1)

% Patents Active = 83.3

Average Co-Inventor Count = 3.6

ph-index = 4

Forward Citations = 69(Granted Patents)

Company Filing History:

19 out of 2,874

Hitachi-High-Technologies Corporation

patents

5 out of 1,372

Hitachi High-Tech Corporation

where one patent can have more than one assignee

Years Active: 2005-2025

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24 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12400383 - Training method for learning apparatus, and image generation system (2025-08-26),

2. 12340970 - Charged particle beam device, and method for controlling charged particle beam device (2025-06-24),

3. 12327708 - Charged particle beam device and aberration correction method (2025-06-10),

4. 11769649 - Multipole unit and charged particle beam device (2023-09-26),

5. 10840060 - Scanning electron microscope and sample observation method (2020-11-17),

6. 10727024 - Charged particle beam device and aberration correction method for charged particle beam device (2020-07-28),

7. 10446361 - Aberration correction method, aberration correction system, and charged particle beam apparatus (2019-10-15),

8. 9991092 - Scanning electron microscope and sample observation method (2018-06-05),

9. 9830524 - Method for estimating shape before shrink and CD-SEM apparatus (2017-11-28),

10. 9287084 - Aberration corrector and charged particle beam apparatus using the same (2016-03-15),

11. 9202665 - Charged particle beam apparatus for removing charges developed on a region of a sample (2015-12-01),

12. 8309923 - Sample observing method and scanning electron microscope (2012-11-13),

13. 8207513 - Charged particle beam apparatus (2012-06-26),

14. 7928384 - Localized static charge distribution precision measurement method and device (2011-04-19),

15. 7910884 - Apparatus and method for inspection and measurement (2011-03-22),

Title: The Innovative Journey of Zhaohui Cheng

Introduction: Zhaohui Cheng is a pioneering inventor based in Tokyo, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Zhaohui Cheng holds several patents in the areas of artificial intelligence, robotics, and renewable energy technologies, showcasing his commitment to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Zhaohui Cheng has worked with leading tech companies and research institutions, playing a key role in developing cutting-edge solutions that have revolutionized various industries.

Collaborations: Throughout his career, Zhaohui Cheng has collaborated with top engineers, scientists, and researchers from around the world, fostering a culture of innovation and knowledge sharing that has led to significant technological breakthroughs.

Conclusion: Zhaohui Cheng's relentless pursuit of innovation and his passion for creating a better future through technology make him a true visionary in the world of inventions and patents.