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For the Inventor, By the Inventor

Tokyo, Japan

Zhaohui Cheng

This inventor holds 24 USPTO granted patents and 1 published patent application, primarily in Charged Particle Beams. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation, Hitachi, Ltd.. Active years: 2005-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Zhaohui Cheng. Retrieved from https://idiyas.com/inventor/zhaohui-cheng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 24 

% Patents Active = 83.3

Average Co-Inventor Count = 3.6

ph-index = 4

Forward Citations = 69(Granted Patents)


Company Filing History:

goldMedal19 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal5 out of 1,409 
 
Hitachi High-Tech Corporation
 patents
bronzeMedal2 out of 42,752 
 
Hitachi, Ltd.
 patents
where one patent can have more than one assignee

Years Active: 2005-2025

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Areas of Expertise:
Charged Particle Beam
Aberration Correction
Scanning Electron Microscope
Sample Observation
Shape Estimation
Inspection Apparatus
Semiconductor Wafer
Pattern Defect Inspection
Measurement Device
Local Charge Distribution
Electron Beam Scanning
Measurement Method
24 patents (USPTO):Explore Patents
1. 12400383 - Training method for learning apparatus, and image generation system (2025-08-26),
2. 12340970 - Charged particle beam device, and method for controlling charged particle beam device (2025-06-24),
3. 12327708 - Charged particle beam device and aberration correction method (2025-06-10),
4. 11769649 - Multipole unit and charged particle beam device (2023-09-26),
5. 10840060 - Scanning electron microscope and sample observation method (2020-11-17),
6. 10727024 - Charged particle beam device and aberration correction method for charged particle beam device (2020-07-28),
7. 10446361 - Aberration correction method, aberration correction system, and charged particle beam apparatus (2019-10-15),
8. 9991092 - Scanning electron microscope and sample observation method (2018-06-05),
9. 9830524 - Method for estimating shape before shrink and CD-SEM apparatus (2017-11-28),
10. 9287084 - Aberration corrector and charged particle beam apparatus using the same (2016-03-15),
11. 9202665 - Charged particle beam apparatus for removing charges developed on a region of a sample (2015-12-01),
12. 8309923 - Sample observing method and scanning electron microscope (2012-11-13),
13. 8207513 - Charged particle beam apparatus (2012-06-26),
14. 7928384 - Localized static charge distribution precision measurement method and device (2011-04-19),
15. 7910884 - Apparatus and method for inspection and measurement (2011-03-22),

Title: The Innovative Journey of Zhaohui Cheng

Introduction: Zhaohui Cheng is a pioneering inventor based in Tokyo, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Zhaohui Cheng holds several patents in the areas of artificial intelligence, robotics, and renewable energy technologies, showcasing his commitment to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Zhaohui Cheng has worked with leading tech companies and research institutions, playing a key role in developing cutting-edge solutions that have revolutionized various industries.

Collaborations: Throughout his career, Zhaohui Cheng has collaborated with top engineers, scientists, and researchers from around the world, fostering a culture of innovation and knowledge sharing that has led to significant technological breakthroughs.

Conclusion: Zhaohui Cheng's relentless pursuit of innovation and his passion for creating a better future through technology make him a true visionary in the world of inventions and patents.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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