The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Mar. 03, 2022
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Zhaohui Cheng, Tokyo, JP;

Yasutaka Toyoda, Tokyo, JP;

Hideto Dohi, Tokyo, JP;

Hiroya Ohta, Tokyo, JP;

Hideyuki Kazumi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/60 (2006.01); G06T 5/80 (2024.01); G06T 7/13 (2017.01);
U.S. Cl.
CPC ...
G06T 11/60 (2013.01); G06T 5/80 (2024.01); G06T 7/13 (2017.01); G06T 2207/20081 (2013.01);
Abstract

A training method that performs learning using appropriate low-quality image and high-quality image is provided. The invention is directed to a training method including executing learning by inputting a first image generated under a first image generation condition and a second image generated under a second image generation condition different from the first image generation condition to a learning apparatus that adjusts parameters so as to suppress an error between an input image and a converted image, in which the second image is selected such that an index value extracted from the second image is the same as or has a predetermined relationship with an index value extracted from the first image, or the second image is output from a second image generation tool different from a first image generation tool for generating the first image.


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