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For the Inventor, By the Inventor

Kodaira, Japan

Hiroya Ohta

USPTO Granted Patents = 46 

 

Average Co-Inventor Count = 3.6

ph-index = 9

Forward Citations = 340(Granted Patents)


Location History:

  • Kodaira, JP (2000 - 2008)
  • Kokubunji, JP (1994 - 2013)
  • Tokyo, JP (2005 - 2024)

Company Filing History:

goldMedal22 out of 2,874 
 
Hitachi-high-technologies Corporation
 patents
silverMedal15 out of 90,697 
 
Canon Kabushiki Kaisha
 patents
bronzeMedal14 out of 42,496 
 
Hitachi, Ltd.
 patents
4. 5 out of 1,125 
 
Hitachi High-tech Corporation
 patents
5. 2 out of 2,253 
 
Adv Antest Corporation
 patents
6. 3 out of 832,843 
Other
 patents
where one patent can have more than one assignee

Years Active: 1994-2025

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Areas of Expertise:
Charged Particle Beam Device
Pattern Measurement Device
Electron Beam Inspection Method
Semiconductor Inspection Device
Scanning Electron Microscope
Electron Beam Writing System
Aberration Corrector
Multi-Electron Beam Exposure Method
Electron Beam Lithography
Device Fabrication Method
Calibration Sample
Electron Gun
46 patents (USPTO):Explore Patents
1. 12400383 - Training method for learning apparatus, and image generation system (2025-08-26),
2. 12205790 - Charged particle beam device (2025-01-21),
3. 12174551 - Pattern measurement device and pattern measurement method (2024-12-24),
4. 11869745 - Charged particle beam device (2024-01-09),
5. 11435178 - Calibration sample, electron beam adjustment method and electron beam apparatus using same (2022-09-06),
6. 11353798 - Pattern measurement device and pattern measurement method (2022-06-07),
7. 10816332 - Pattern measurement device and pattern measurement method (2020-10-27),
8. 10636618 - Charged particle beam apparatus (2020-04-28),
9. 10629408 - Charged particle beam device (2020-04-21),
10. 10262830 - Scanning electron microscope and electron trajectory adjustment method therefor (2019-04-16),
11. 9991088 - Charged particle beam device and aberration corrector (2018-06-05),
12. 9966225 - Charged particle beam device, simulation method, and simulation device (2018-05-08),
13. 9846133 - Semiconductor inspection device including a counter electrode with adjustable potentials used to obtain images for detection of defects, and inspection method using charged particle beam (2017-12-19),
14. 9508611 - Semiconductor inspection method, semiconductor inspection device and manufacturing method of semiconductor element (2016-11-29),
15. 8592776 - Charged particle beam apparatus (2013-11-26),

Title: Hiroya Ohta: Pioneering Inventor from Kodaira, Japan

Introduction: Hiroya Ohta is a distinguished inventor hailing from Kodaira, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Hiroya Ohta holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous commitment to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Hiroya Ohta has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant technological breakthroughs in various industries.

Collaborations: Throughout his career, Hiroya Ohta has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge exchange that has been instrumental in his success as an inventor.

Conclusion: Hiroya Ohta's relentless passion for innovation and his unwavering dedication to creating cutting-edge technologies have solidified his reputation as a visionary inventor in the global tech community.

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