Hiroya Ohta

This inventor holds 48 USPTO granted patents and 5 published patent applications and 4 EPO patents, primarily in Charged Particle Beam Technology. Top assignees: Hitachi-High-Technologies Corporation, Canon Kabushiki Kaisha, Hitachi, Ltd.. Active years: 1994-2026.

USPTO Granted Patents = 48 (Patent Applications = 5)

% Patents Active = 72.9

EPO Patents = 4 (Patent Applications = 2)

Average Co-Inventor Count = 3.7

ph-index = 9

Forward Citations = 348(Granted Patents)

Location History:

Kodaira, JP (2000 - 2008)
Kokubunji, JP (1994 - 2013)
Tokyo, JP (2005 - 2024)

Company Filing History:

22 out of 2,874

Hitachi-High-Technologies Corporation

patents

15 out of 92,799

Canon Kabushiki Kaisha

Hitachi High-Tech Corporation

patents

5. 2 out of 2,278

Adv Antest Corporation

patents

6. 3 out of 834,350

Other

patents

where one patent can have more than one assignee

Years Active: 1994-2026

Loading Chart...

Areas of Expertise:

Charged Particle Beam

Electron Beam Inspection

Semiconductor Inspection

Pattern Measurement

Aberration Correction

Device Fabrication

Electron Gun

Multi-Electron Beam

Scanning Electron Microscope

Calibration Sample

Image Generation

Measurement Method

48 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12609274 - Charged particle beam device (2026-04-21),

2. 12525430 - Charged particle beam apparatus (2026-01-13),

3. 12400383 - Training method for learning apparatus, and image generation system (2025-08-26),

4. 12205790 - Charged particle beam device (2025-01-21),

5. 12174551 - Pattern measurement device and pattern measurement method (2024-12-24),

6. 11869745 - Charged particle beam device (2024-01-09),

7. 11435178 - Calibration sample, electron beam adjustment method and electron beam apparatus using same (2022-09-06),

8. 11353798 - Pattern measurement device and pattern measurement method (2022-06-07),

9. 10816332 - Pattern measurement device and pattern measurement method (2020-10-27),

10. 10636618 - Charged particle beam apparatus (2020-04-28),

11. 10629408 - Charged particle beam device (2020-04-21),

12. 10262830 - Scanning electron microscope and electron trajectory adjustment method therefor (2019-04-16),

13. 9991088 - Charged particle beam device and aberration corrector (2018-06-05),

14. 9966225 - Charged particle beam device, simulation method, and simulation device (2018-05-08),

15. 9846133 - Semiconductor inspection device including a counter electrode with adjustable potentials used to obtain images for detection of defects, and inspection method using charged particle beam (2017-12-19),

Title: Hiroya Ohta: Pioneering Inventor from Kodaira, Japan

Introduction: Hiroya Ohta is a distinguished inventor hailing from Kodaira, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Hiroya Ohta holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous commitment to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Hiroya Ohta has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant technological breakthroughs in various industries.

Collaborations: Throughout his career, Hiroya Ohta has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge exchange that has been instrumental in his success as an inventor.

Conclusion: Hiroya Ohta's relentless passion for innovation and his unwavering dedication to creating cutting-edge technologies have solidified his reputation as a visionary inventor in the global tech community.