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Adv Antest Corporation

USPTO Granted Patents = 2,280

% Expired Patents = 33.4

EPO Patents = 39

Trademarks = 5

Forward Citations = 15,216

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1,230 inventors (with patents filed for the assignee):

Toshiyuki Okayasu (118 out of 118 patents)

Takahiro Yamaguchi (88 out of 141 patents)

Masahiro Ishida (84 out of 273 patents)

4. Masakatsu Suda (44 out of 44 patents)

5. Daisuke Watanabe (42 out of 142 patents)

6. Yasuo Furukawa (41 out of 47 patents)

7. Theodore A Khoury (39 out of 41 patents)

8. Shoji Kojima (38 out of 38 patents)

9. Koji Asami (33 out of 33 patents)

10. Kiyotaka Ichiyama (33 out of 33 patents)

11. Mani Soma (30 out of 37 patents)

12. Shinya Sato (29 out of 95 patents)

13. Yoshihiro Hashimoto (28 out of 44 patents)

14. Takashi Sekino (28 out of 28 patents)

15. Toshiyuki Kiyokawa (26 out of 26 patents)

Core Competencies:

Automated Test Equipment

Semiconductor Testing

Measurement Systems

Signal Processing

Electronic Components

CXL Protocol

Optical Testing

Defect Detection

Testing Methods

Data Calibration

Device Under Test

Temperature Control

2,280 patents: Sort by Forward Citations

1. 12750040 - Signal processing apparatus for generating a plurality of output samples using combiner logic based on a hiearchical tree structure (2026-09-29),

2. 12748144 - Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus (2026-09-29),

3. 12736582 - Device handling apparatus and device testing apparatus (2026-09-15),

4. 12727435 - Test method, manufacturing method, panel level package, and test apparatus (2026-09-01),

5. 12704547 - Automated test equipment and method using a trigger generation (2026-08-11),

6. 12699128 - Methods and devices for testing a device under test using test site specific thermal control signaling (2026-08-04),

7. 12681820 - Determination apparatus, test system, determination method, and computer-readable medium (2026-07-14),

8. 12670306 - Detection method, system, electronic equipment, and storage medium of product test data (2026-06-30),

9. 12669555 - Image output apparatus, method, program, and recording medium (2026-06-30),

10. 12665042 - Write latency testing systems and methods (2026-06-23),

11. 12638501 - Processor test pattern generation and application for tester systems (2026-05-26),

12. 12625178 - Automatic test equipment (2026-05-12),

13. 12625176 - Testing apparatus, testing method, and computer-readable storage medium (2026-05-12),

14. 12625071 - Electromagnetic wave measuring apparatus, method, and recording medium (2026-05-12),

15. 12602556 - Systems and methods for determining a valid state of measurement systems (2026-04-14),

Advantest Corporation, headquartered in Tokyo, Japan, specializes in the development and manufacturing of automated test equipment for the semiconductor industry. The company focuses on advanced measurement systems that enhance the efficiency and accuracy of semiconductor testing. Its core technologies encompass signal processing, optical testing, and defect detection, catering to the evolving needs of electronic components and protocols such as CXL. Advantest is committed to innovation in automated testing solutions, supporting the growth of the semiconductor market.

Profile summary based on public USPTO records.

Company Badge

USPTO Data Jan 1 1976 - Sep 29 2026

Adv Antest Corporation

2,280 Patents

#62 in Tokyo

#113 in Japan

#445 in the World

Adv Antest Corporation

Forward Citations = 15,216

1,230 inventors:

Toshiyuki Okayasu (118 out of 118 patents)

Takahiro Yamaguchi (88 out of 141 patents)

Masahiro Ishida (84 out of 273 patents)

4. Masakatsu Suda (44 out of 44 patents)

5. Daisuke Watanabe (42 out of 142 patents)

Please report any incorrect information to [email protected]

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