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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12748144 B1

PDFFull Text
Date of Patent:
Sep. 29, 2026

Filed:

Jul. 12, 2024

Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus

Applicant:

Advantest Corporation, Tokyo, JP;

Inventor:

Daisuke Watanabe, Saitama, JP;

Assignee:

ADVANTEST CORPORATION, Tokyo, JP;

Attorney:

Greenblum & Bernstein, P.L.C.

Primary Examiner:

Raul J Rios Russo

Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/04 (2006.01); G01R 31/302 (2006.01); G01R 31/308 (2006.01); G01R 31/3181 (2006.01); G01R 31/3183 (2006.01); H04B 10/80 (2013.01); H04L 41/0896 (2022.01);
U.S. Cl.
CPC ...
G01R 31/2841 (2013.01); G01R 1/0416 (2013.01); G01R 31/2889 (2013.01); G01R 31/3025 (2013.01); G01R 31/308 (2013.01); G01R 31/31813 (2013.01); G01R 31/318314 (2013.01); H04B 10/80 (2013.01); H04L 41/0896 (2013.01);
Abstract

A testing apparatus includes a driver and a test signal providing section. The driver is connected electrically to a device under test and arranged to provide a test signal to the device under test. The test signal providing section is arranged to provide the test signal to the driver. The driver is closer than the test signal providing section to the device under test. A bandwidth of communication between the driver and the test signal providing section is broader than a bandwidth of communication between the driver and the device under test.

Find Patent Forward Citations

Watanabe, Daisuke. (2026). Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus (U.S. Patent No. 12748144). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12748144

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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