The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Jul. 12, 2024
Applicant:
Advantest Corporation, Tokyo, JP;
Inventor:
Daisuke Watanabe, Saitama, JP;
Assignee:
ADVANTEST CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/04 (2006.01); G01R 31/302 (2006.01); G01R 31/308 (2006.01); G01R 31/3181 (2006.01); G01R 31/3183 (2006.01); H04B 10/80 (2013.01); H04L 41/0896 (2022.01);
U.S. Cl.
CPC ...
G01R 31/2841 (2013.01); G01R 1/0416 (2013.01); G01R 31/2889 (2013.01); G01R 31/3025 (2013.01); G01R 31/308 (2013.01); G01R 31/31813 (2013.01); G01R 31/318314 (2013.01); H04B 10/80 (2013.01); H04L 41/0896 (2013.01);
Abstract
A testing apparatus includes a driver and a test signal providing section. The driver is connected electrically to a device under test and arranged to provide a test signal to the device under test. The test signal providing section is arranged to provide the test signal to the driver. The driver is closer than the test signal providing section to the device under test. A bandwidth of communication between the driver and the test signal providing section is broader than a bandwidth of communication between the driver and the device under test.