The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2026

Filed:

Jan. 31, 2023
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Matthias Werner, Bibertal, DE;

Martin Fischer, Heilbronn, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2834 (2013.01); G01R 31/2867 (2013.01); G01R 31/2874 (2013.01); G01R 31/2893 (2013.01); G01R 31/31725 (2013.01); G01R 31/31905 (2013.01);
Abstract

Embodiments of the present invention provide an automated test equipment (a 'tester') for testing a device under test, including a bidirectional dedicated real-time handler interface. Some embodiments include an interface having a trigger function, a fixed endpoint interface, an interface arranged on a test head, and/or a number of lines/communication channels adapted to a specific communication task, without separate signal lines, for example. The bidirectional dedicated real-time handler interface can be used to transmit thermal control signals, and the transmitted signals can be test site specific. The real-time signaling advantageously improves testing accuracy and efficiency.


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