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For the Inventor, By the Inventor

Tokyo, Japan

Toshiyuki Okayasu

This inventor holds 118 USPTO granted patents and 8 published patent applications, primarily in Test Apparatus Design (CPC class H04B1-004). Top assignees: Adv Antest Corporation, Tohoku University, The Furukawa Electric Co., Ltd.. Active years: 1996-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshiyuki Okayasu. Retrieved from https://idiyas.com/inventor/toshiyuki-okayasu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 118 

% Patents Active = 40.7

Average Co-Inventor Count = 1.7

ph-index = 13

Forward Citations = 548(Granted Patents)

Forward Citations (Not Self Cited) = 525(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Kurihashi, JP (1996)
  • Kurihashi-machi, JP (1998)
  • Kitakasushika-gun, JP (2000)
  • Ohtone-machi, JP (2000)
  • Kita Katsushika-gun, JP (1998 - 2002)
  • Gunma, JP (2002)
  • Ohra-gun, JP (2003)
  • Nerima-ku, JP (2004)
  • Saitama, JP (1999 - 2014)
  • Tokyo, JP (1999 - 2015)

Company Filing History:

goldMedal118 out of 2,280 
 
Adv Antest Corporation
 patents
silverMedal3 out of 1,051 
 
Tohoku University
 patents
bronzeMedal2 out of 2,643 
 
The Furukawa Electric Co., Ltd.
 patents
where one patent can have more than one assignee

Years Active: 1996-2015

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Areas of Expertise:
Test Apparatus
Semiconductor Testing
Electronic Device
Manufacturing Method
Voltage Margin Test
Digital Modulated Signal
Clock Data Recovery
Noise Measurement
Timing Generator
Data Receiving Circuit
Memory Device
Switching Device
118 patents (USPTO):Explore Patents
1. 8933716 - Test apparatus and testing method (2015-01-13),
2. 8896332 - Test apparatus with voltage margin test (2014-11-25),
3. 8892381 - Test apparatus and manufacturing method (2014-11-18),
4. 8754631 - Test apparatus for digital modulated signal (2014-06-17),
5. 8614465 - Electronic device and manufacturing method (2013-12-24),
6. 8610449 - Wafer unit for testing and test system (2013-12-17),
7. 8593166 - Semiconductor wafer, semiconductor circuit, substrate for testing and test system (2013-11-26),
8. 8554514 - Test apparatus and test method (2013-10-08),
9. 8537935 - Clock data recovery circuit and method (2013-09-17),
10. 8502549 - Test apparatus and driver circuit (2013-08-06),
11. 8473248 - Test apparatus and test method (2013-06-25),
12. 8471754 - Time measurement circuit (2013-06-25),
13. 8466702 - Test system and substrate unit for testing (2013-06-18),
14. 8466701 - Power supply stabilizing circuit, electronic device and test apparatus (2013-06-18),
15. 8456170 - Test apparatus for digital modulated signal (2013-06-04),

Title: Innovations of Toshiyuki Okayasu: A Pioneer in Testing Apparatus Technologies

Introduction

Toshiyuki Okayasu, an esteemed inventor based in Tokyo, Japan, has made significant contributions to the field of testing apparatus technologies. With an impressive portfolio of 118 patents, his work reflects a commitment to advancing electronic testing methodologies and devices.

Latest Patents

Among his latest innovations, Toshiyuki Okayasu has developed a comprehensive test apparatus and testing method designed to enhance the accuracy and efficiency of device under test (DUT) evaluations. This invention features a main power supply that delivers voltage to the DUT while a control pattern generator oversees a pulse sequence to regulate the test process. Additionally, a unique compensation circuit intermittently introduces a compensation current to optimize testing conditions. Furthermore, his patented test apparatus includes a voltage margin test mechanism that enables precise adjustment of the test signal, ensuring robustness in DUT assessments.

Career Highlights

Before establishing himself as a prominent figure in patented innovations, Okayasu held key positions at renowned institutions, including Advantest Corporation and the National University Corporation Tohoku University. His experience in these organizations has equipped him with the technical knowledge and collaborative skills necessary to drive innovation in testing technologies.

Collaborations

Throughout his career, Toshiyuki Okayasu has worked alongside talented professionals, including Daisuke Watanabe and Kazuhiro Yamamoto. These collaborations have fostered an environment of creativity and resourcefulness, leading to significant advancements in the field of electronic testing and device evaluation.

Conclusion

Toshiyuki Okayasu stands as a significant innovator in the realm of electronic testing technologies. His extensive patent portfolio and collaborative projects exemplify his contributions to enhancing the efficiency and accuracy of testing methods. As the field continues to evolve, inventions like those of Okayasu set the foundation for future developments in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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