The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2013
Filed:
Nov. 24, 2010
Applicants:
Daisuke Watanabe, Saitama, JP;
Toshiyuki Okayasu, Saitama, JP;
Inventors:
Daisuke Watanabe, Saitama, JP;
Toshiyuki Okayasu, Saitama, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a test wafer unit that tests a plurality of circuits under test formed on a wafer under test. The test wafer unit comprises a test wafer that is formed of a semiconductor material and exchanges signals with each of the circuits under test, and a plurality of loop-back sections that are provided in the test wafer to correspond to the plurality of circuits under test and that each supply the corresponding circuit under test with a loop-back signal corresponding to a signal received from the corresponding circuit under test.