The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Nov. 30, 2010
Daisuke Watanabe, Saitama, JP;
Toshiyuki Okayasu, Saitama, JP;
Daisuke Watanabe, Saitama, JP;
Toshiyuki Okayasu, Saitama, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A test system includes a test substrate that transmits/receives signals to/from a semiconductor wafer, and a control apparatus to control the test substrate. The semiconductor wafer includes an external terminal coupled to an external measurement circuit, a plurality of selecting wiring lines provided to receive/transmit signals to/from the corresponding the measuring points, and a selecting section that selects one of the selecting wiring lines and that allows signal transmission between the corresponding measuring point and the external terminal through the selected selecting wiring line. The test substrate includes a measurement circuit that is coupled to the external terminal of the semiconductor wafer and that measures an electrical characteristic of a signal transmitted through the selecting wiring line selected by the selecting section, and a control section that controls which one of the measurement wiring lines is to be selected by the selecting section in the semiconductor wafer.