The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2011

Filed:

Jan. 06, 2009
Applicants:

Zhaohui Cheng, Tokyo, JP;

Natsuki Tsuno, Kunitachi, JP;

Inventors:

Zhaohui Cheng, Tokyo, JP;

Natsuki Tsuno, Kunitachi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/22 (2006.01); G21K 7/00 (2006.01); H01J 37/256 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electrification control electrode B is installed at a measured or inspected specimen side of an electrification control electrode A, and a constant voltage is applied from an electrification control electrode control portion of an electrification control electrode B according to an electrification state of a specimen, whereby a variation of an electrification state and a potential barrier of a specimen surface formed before an inspection is suppressed. A retarding potential is applied by an electrification control electrode, and the electrification control electrode B is disposed below the electrification control electrode A adjusted to equal potential to a specimen. As a result, it is possible to adjust the amount that secondary electrons emitted from a specimen such as a wafer to which a primary electron beam is irradiated return to a specimen, and thus it is possible to stably maintain an inspection condition of high sensitivity during an inspection.


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Cheng, Zhaohui. (2011). Apparatus and method for inspection and measurement (U.S. Patent No. 7910884). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7910884

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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