Tokyo, Japan

Natsuki Tsuno

USPTO Granted Patents = 40 

Average Co-Inventor Count = 4.1

ph-index = 5

Forward Citations = 55(Granted Patents)


Location History:

  • Kunitachi, JP (2009 - 2011)
  • Saitama, JP (2013)
  • Tokyo, JP (2014 - 2024)

Company Filing History:


Years Active: 2009-2025

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40 patents (USPTO):

Title: Innovator Spotlight: Natsuki Tsuno - Pioneering Inventor in Tokyo

Introduction: Natsuki Tsuno, a prolific inventor based in Tokyo, JP, has made significant contributions to the field of charged particle beam devices and electrical characteristics evaluation systems. With an impressive portfolio of 33 patents, Tsuno continues to push the boundaries of innovation in his work.

Latest Patents: Tsuno's recent inventions showcase his expertise in developing cutting-edge technologies. One of his latest patents is the Charged Particle Beam Device, designed to enhance the contrast of observation images of samples based on changing light absorption characteristics. Another notable patent is the System for Deriving Electrical Characteristics and Non-Transitory Computer-Readable Medium, which allows for the evaluation of electrical characteristics of elements on samples.

Career Highlights: Tsuno has a rich professional background, having worked at renowned companies such as Hitachi High-Tech Corporation and Hitachi-High-Technologies Corporation. His experience and expertise in these organizations have undoubtedly influenced his innovative approach to invention.

Collaborations: Throughout his career, Tsuno has collaborated with talented individuals in the field. Notable coworkers include Yohei Nakamura and Muneyuki Fukuda, who have contributed to Tsuno's success in developing groundbreaking technologies.

Conclusion: Natsuki Tsuno stands out as a leading figure in the realm of innovations, with a remarkable track record of patents and a dedication to advancing technology. His inventive spirit and collaborative efforts continue to inspire the world of invention and pave the way for future breakthroughs in charged particle beam devices and electrical characteristics evaluation systems.

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