Hamilton, OH, United States of America

William Stewart McKnight

USPTO Granted Patents = 15 


Average Co-Inventor Count = 4.2

ph-index = 6

Forward Citations = 216(Granted Patents)


Location History:

  • Fairfield, OH (US) (1985 - 2004)
  • Hamilton, OH (US) (2004 - 2012)

Company Filing History:


Years Active: 1985-2012

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15 patents (USPTO):

Title: **William Stewart McKnight: Innovator in Eddy Current Inspection Technologies**

Introduction

William Stewart McKnight is a prominent inventor based in Hamilton, Ohio, who has made significant contributions to the field of eddy current inspection technologies. With a remarkable portfolio comprising 15 patents, McKnight has demonstrated a strong commitment to advancing innovative solutions in his area of expertise.

Latest Patents

Among his latest innovations, McKnight developed a **System and method for eddy current inspection of parts with complex geometries**. This cutting-edge inspection system employs a multi-dimensional array of eddy current sensors that conform to unique three-dimensional shapes of parts. The system is equipped with a controller that electronically scans the part, leveraging an electrical connection to an eddy current instrument. Furthermore, a processor analyzes the output from the instrument and controller to facilitate effective inspection.

Another noteworthy patent is the **Methods and apparatus for testing a component**. This method focuses on inspecting components with intricate surface profiles that include both local minima and maxima. It involves positioning an eddy current probe near the component's surface, generating two distinct position indications, and interpolating these indications to outline the component's profile accurately.

Career Highlights

McKnight's career is marked by his tenure at General Electric Company, where he has harnessed his skills and knowledge to push the boundaries of technology. His work has not only contributed to advancements in inspection methods but has also enhanced quality assurance in manufacturing processes.

Collaborations

Throughout his career, McKnight has had the opportunity to collaborate with esteemed colleagues, including Ui Won Suh and Changting Wang. These partnerships have played a pivotal role in driving research and development initiatives, further solidifying McKnight's reputation as a leader in his field.

Conclusion

William Stewart McKnight's contributions to the field of eddy current inspection technologies through his innovative patents underscore his status as a leading inventor. His dedication to engineering excellence continues to inspire future innovations, ensuring that the industry benefits from his groundbreaking work.

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