The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2012
Filed:
Nov. 25, 2008
Changting Wang, Niskayuna, NY (US);
Yury Alexeyevich Plotnikov, Niskayuna, NY (US);
Ui Won Suh, Cincinnati, OH (US);
William Stewart Mcknight, Hamilton, OH (US);
Changting Wang, Niskayuna, NY (US);
Yury Alexeyevich Plotnikov, Niskayuna, NY (US);
Ui Won Suh, Cincinnati, OH (US);
William Stewart McKnight, Hamilton, OH (US);
General Electric Company, Niskayuna, NY (US);
Abstract
An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.