Cincinnati, OH, United States of America

Ui Won Suh

USPTO Granted Patents = 22 



Average Co-Inventor Count = 2.9

ph-index = 8

Forward Citations = 154(Granted Patents)


Location History:

  • Cincinnatti, OH (US) (2002)
  • Cincinnati, OH (US) (2000 - 2012)

Company Filing History:


Years Active: 2000-2012

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22 patents (USPTO):

Title: Innovations by Ui Won Suh: Pioneering Eddy Current Inspection Technologies

Introduction

Ui Won Suh, based in Cincinnati, OH, is an accomplished inventor with an impressive portfolio of 22 patents. He has made significant contributions to the fields of inspection technology and component analysis, particularly through the innovative application of eddy current methods. His work is instrumental in enhancing the accuracy and efficiency of inspection processes in various industries.

Latest Patents

Among his latest patents is a "System and method for eddy current inspection of parts with complex geometries." This patent describes an advanced inspection system comprising a multi-dimensional array of eddy current sensors that adapt to the contours of three-dimensional shapes. The system includes a controller designed to electronically scan the part, as well as a processor that analyzes data from the eddy current instrument to ensure comprehensive inspection of the component.

Another notable innovation is the "Methods and apparatus for testing a component," which presents a technique for inspecting components with complex surface profiles, including local minima and maxima. This method involves utilizing an eddy current probe to generate multiple position indicators, thereby allowing for precise interpolation and profiling of the surface.

Career Highlights

Ui Won Suh has had a noteworthy career contributing to significant technological advancements. He has worked with General Electric Company, where his expertise in eddy current technologies was further developed and recognized. His innovative ideas and practical solutions have positioned him as a leading figure in inspection technology.

Collaborations

Throughout his career, Ui Won Suh has collaborated with esteemed colleagues, including William Stewart McKnight and Changting Wang. These collaborations have fostered an environment of innovation and creativity, leading to breakthroughs in the development of inspection systems and methodologies.

Conclusion

In conclusion, Ui Won Suh's contributions to the field of inspection technology through his patented innovations have made a profound impact on the industry. His work in eddy current inspection systems has paved the way for advancements that enhance the safety and reliability of various components. As he continues to innovate, Ui Won Suh remains a prominent inventor in the realm of inspection technologies.

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