The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2011

Filed:

Nov. 05, 2007
Applicants:

Haiyan Sun, Niskayuna, NY (US);

Yuri Plotnikov, Niskayuna, NY (US);

Changting Wang, Niskayuna, NY (US);

William Stewart Mcknight, Hamilton, OH (US);

Ui Suh, Cincinnati, OH (US);

Inventors:

Haiyan Sun, Niskayuna, NY (US);

Yuri Plotnikov, Niskayuna, NY (US);

Changting Wang, Niskayuna, NY (US);

William Stewart McKnight, Hamilton, OH (US);

Ui Suh, Cincinnati, OH (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of assembling an eddy current probe for use in nondestructive testing of a sample is described. The method includes positioning at least one substantially planar spiral drive coil within the eddy current probe, such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling at least one unpackaged solid-state magnetic field sensor to the at least one drive coil.


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