The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2008
Filed:
Apr. 05, 2005
Suneel Tumkur Shankarappa, Bangalore, IN;
William Stewart Mcknight, Hamilton, OH (US);
Vamshi Krishna Reddy Kommareddy, Bangalore, IN;
Ui Won Suh, Cincinnati, OH (US);
Mandar Diwakar Godbole, Bangalore, IN;
Anjani Narendra Schrad, West Chester, OH (US);
Prafull Sharma, Indore, IN;
Suneel Tumkur Shankarappa, Bangalore, IN;
William Stewart McKnight, Hamilton, OH (US);
Vamshi Krishna Reddy Kommareddy, Bangalore, IN;
Ui Won Suh, Cincinnati, OH (US);
Mandar Diwakar Godbole, Bangalore, IN;
Anjani Narendra Schrad, West Chester, OH (US);
Prafull Sharma, Indore, IN;
General Electric Company, Niskayuna, NY (US);
Abstract
A method for generating a scanplan for inspection of a component is provided. The method includes loading a geometric model of the component and generating the scanplan of the component based on the geometric model and at least one scanning parameter. A method of inspecting a component is also provided and includes loading a geometric model of the component, generating a scanplan of the component based on the geometric model and at least one scanning parameter, mounting the component on an inspection system manipulator and inspecting the component including moving an inspection probe relative to the component using the scanplan.