The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Dec. 21, 2005
Ui Won Suh, Cincinnati, OH (US);
Gigi Olive Gambrell, West Chester, OH (US);
William Mcknight, Hamilton, OH (US);
Preeti Pisupati, Bangalore, IN;
Ui Won Suh, Cincinnati, OH (US);
Gigi Olive Gambrell, West Chester, OH (US);
William McKnight, Hamilton, OH (US);
Preeti Pisupati, Bangalore, IN;
General Electric Company, Schenectady, NY (US);
Abstract
A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes generating a raw image of a component under test utilizing an eddy current inspection system, decomposing the raw image into a plurality of images wherein each image includes a different frequency component, and reconstructing at least one final image of the component that includes frequency components that are relevant to an eddy current flaw signal.