The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2011
Filed:
Nov. 05, 2007
William Stewart Mcknight, Hamilton, OH (US);
Ui Suh, Cincinnati, OH (US);
Yuri Plotnikov, Niskayuna, NY (US);
Changting Wang, Niskayuna, NY (US);
Ralph Gerald Isaacs, Cincinnati, OH (US);
William Stewart McKnight, Hamilton, OH (US);
Ui Suh, Cincinnati, OH (US);
Yuri Plotnikov, Niskayuna, NY (US);
Changting Wang, Niskayuna, NY (US);
Ralph Gerald Isaacs, Cincinnati, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.