The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2006
Filed:
Dec. 21, 2004
Mottito Togo, Bangalore, IN;
Changting Wang, Schenectady, NY (US);
Yuri Alexeyevich Plotnikov, Niskayuna, NY (US);
Shyamsunder Tondanur Mandayam, Bangalore, IN;
William Stewart Mcknight, Hamilton, OH (US);
Walter Joseph Bantz, West Chester, OH (US);
Ui Won Suh, Cincinnati, OH (US);
Mottito Togo, Bangalore, IN;
Changting Wang, Schenectady, NY (US);
Yuri Alexeyevich Plotnikov, Niskayuna, NY (US);
Shyamsunder Tondanur Mandayam, Bangalore, IN;
William Stewart McKnight, Hamilton, OH (US);
Walter Joseph Bantz, West Chester, OH (US);
Ui Won Suh, Cincinnati, OH (US);
General Electric Company, Niskayuna, NY (US);
Abstract
An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.