The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Jul. 30, 2004
Ui Won Suh, Cincinnati, OH (US);
Gigi Olive Gambrell, West Chester, OH (US);
John William Ertel, New Vienna, OH (US);
William Stewart Mcknight, Hamilton, OH (US);
Ui Won Suh, Cincinnati, OH (US);
Gigi Olive Gambrell, West Chester, OH (US);
John William Ertel, New Vienna, OH (US);
William Stewart McKnight, Hamilton, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.