The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2005
Filed:
Jun. 27, 2003
Brian Michael Davis, West Chester, OH (US);
Robert David Mcclain, Cincinnati, OH (US);
Ui Won Suh, Cincinnati, OH (US);
Seetha Ramaiah Mannava, Cincinnati, OH (US);
Brian Michael Davis, West Chester, OH (US);
Robert David McClain, Cincinnati, OH (US);
Ui Won Suh, Cincinnati, OH (US);
Seetha Ramaiah Mannava, Cincinnati, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A real time method for quality control testing of a laser shock peening process of production workpieces by analysis of natural frequency shifts during the laser shock peening process. One particular embodiment includes laser shock peening surface of the production workpiece by firing a plurality of laser beam pulses on the surface and forming a plurality of corresponding plasmas, each one of the plasmas pulses having a duration in which the plasma causes a region having deep compressive residual stresses to form beneath the surface, measuring at least one natural frequency of the workpiece for each of the laser beam pulses, calculating natural frequency shifts from a baseline natural frequency for the measured natural frequencies for at least a portion of the laser beam pulses, and using the natural frequency shifts for accepting or rejecting the workpiece with respect to pass or fail criteria.